Applied for the characterization of layers, depth profiling and corrosion studies. The technique provides fast, simultaneous analysis of all elements of interest including Na, Li, H, (possible Deuterium), O, Cl from the surface to over 150 microns below a depth resolution of 1 nm.
Study of corrosion potentials, life estimates, analysis of electrochemical impedance and cyclic voltammetries
Solid samples applicable to compatible with high vacuum systems for quantification and composition of the elements composing the surface layer
Used for microstructural characterization of both materials entire sample (SEM scanning electron microscopy) and fine sample (transmission electron microscopy TEM)