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Date
Nov 10, 2014

Glow discharge spectroscopy with pulsed light source

Applied for the characterization of layers, depth profiling and corrosion studies. The technique provides fast, simultaneous analysis of all elements of interest including Na, Li, H, (possible Deuterium), O, Cl from the surface to over 150 microns below a depth resolution of 1 nm.

GRAFICO HORIBA

Corrosion tests

Study of corrosion potentials, life estimates, analysis of electrochemical impedance and cyclic voltammetries

X-ray Photoelectron Spectroscopy (XPS)

Solid samples applicable to compatible with high vacuum systems for quantification and composition of the elements composing the surface layer

Electron Microscopy and Microanalysis of Materials

Used for microstructural characterization of both materials entire sample (SEM scanning electron microscopy) and fine sample (transmission electron microscopy TEM)

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